介绍了一个设计性实验—利用反射式光强位移传感器工作特性曲线上升沿的线性区测量纸张厚度。
The thickness of paper is measured using the linear area of the characteristic curve of an optic-filter sensor.
本系统除可用于码盘的安装调试外，还可测量物体微位移、物体表面形貌及物体厚度，有很大的实用价值。
The system can be used in installing and debugging the disc and also in measuring the micro displacement of the object, the surface shape and thickness of the object, so it has fairly applied value.
德国米铱公司提供的电容式位移传感器被用于以纳米级的精度校准芯片光刻机中镜片的位置，测量晶圆厚度等应用。
Capacitive sensors from Micro-Epsilon are used, among other things, for the positioning, displacement measurement and thickness measurement in the semiconductors area.
本文建立了一种新型的反射式光纤位移传感器的数学模型，并将其用于推力轴承试验中测量油膜厚度的VXI测试系统中。
In this paper, an oil film thickness VXI measuring system of the thrust bearing test has been applied to set up a new kind of optical fiber reflective sensor mod el.
介绍了基于激光位移传感器与电涡流位移传感器的位移差动法在线检测纸坯厚度的原理及测量系统的软硬件设计。
The principle of paper thickness on-line measurement using displacement differential method based on laser displacement sensor and electric eddy current displacement sensor is introduced.
浮法玻璃生产线玻璃带厚度在线检测技术采用了激光三角法位移测量原理，在退火窑热端进行玻璃带测厚的方案。
Adopt laser trigonometry displacement measure theory in the detection of glass thickness on line and the method in the hot side of annealing kiln.
用激光散斑照相的方法测量了因光在透明介质中折射而引起的散斑位移，并求出介质的厚度与折射率。
By means of laser speckle photography, the speckle displacement caused by refraction in transparent medium is measured. The thickness and the index of refraction is then calculated.
本文介绍了一种用激光细光束测量平行平面板折射率的新方法，并分析计算了入射角、平板厚度及光束位移量的误差对折射率测量精度的影响。
A new measurement method of refractive index of plane-parallel plate has been introduced in this paper, which is performed by thin laser beam.
本文介绍了一种用激光细光束测量平行平面板折射率的新方法，并分析计算了入射角、平板厚度及光束位移量的误差对折射率测量精度的影响。
A new measurement method of refractive index of plane-parallel plate has been introduced in this paper, which is performed by thin laser beam.
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