对扫描探针显微镜(SPM)仪器漂移的定量测量的几种方法进行探讨，提出应用二维零位标记进行漂移测量。
Several quantitative drift measurement techniques for scanning probe microscopy (SPM) were introduced. A new method using two-dimensional zero-reference masks was proposed to measure the SPM drift.
利用该系统能有效地克服多面柱体转镜一摆镜二维扫描系统的非线性特性，给后续的计算机实时图像处理工作带来了方便。
The system can overcome effectively the nonlinear feature of polyhedral column rotating-pendulum-mirror, and also bring convenience for succedent computer real image treatment.
整个系统由微机控制，设有自动输涂片机械手装置、显微镜工作台自动二维扫描机构、自动测光、自动拍照等装置。
The system consists of control microcomputer, automatic smear feeding unit, automatic 2-dimension scanning mechanism microscope stage, automatic light detection and automatic photographing unit etc.
整个系统由微机控制，设有自动输涂片机械手装置、显微镜工作台自动二维扫描机构、自动测光、自动拍照等装置。
The system consists of control microcomputer, automatic smear feeding unit, automatic 2-dimension scanning mechanism microscope stage, automatic light detection and automatic photographing unit etc.
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