通过添加测试引脚、设计专用测试模式，内建自测试等方法有效的解决了该芯片电路的功能测试和电气性能测试。
The top metal test pad, special test mode and BIST are adopted in the IC circuits to solve the IC test problem about the chip function test and electric character test.
通过添加测试引脚、设计专用测试模式，内建自测试等方法有效的解决了该芯片电路的功能测试和电气性能测试。
The top metal test pad, special test mode and BIST are adopted in the IC circuits to solve the IC test problem about the chip function test and electric character test.
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