晶体三极管的输入、出特性曲线测试，是模拟电子技术最基本的实验之一。
The test of characteristic curve for input and output of crystal triode is one of the most basic experiments in simulating electronic technology.
本仪器测试的对象为小功率晶体管，包括：各种二极管、双极性三极管、场效应管等。
The testing objects of the instrument are low power transistors, including the common diode, the bipolar transistor, the field effect transistor and so on.
本文给出了TFFEC和三极管的测试性能。
Test results of TFFEC and triode are described and discussed.
利用光敏三极管代替硅光电池和光敏二极管来测试单缝和双缝衍射的光强分布。
This paper introduces a new method to measure the intensity distribution of single seam diffraction by replacing the silicon photocell and light activated diode with light activated triode.
利用光敏三极管代替硅光电池和光敏二极管来测试单缝和双缝衍射的光强分布。
This paper introduces a new method to measure the intensity distribution of single seam diffraction by replacing the silicon photocell and light activated diode with light activated triode.
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