The test chip will enable the correlationof the simulation models to the FinFET process and contains test structures, standard cells, a PLL and embedded SRAMs. The memory instances include high-density SRAMs designed to operate at very low voltages and high-speed SRAMs to validate the process performance.
The study found there was a positive link between good information technology and national test results, of 0.07 under the Spearman Rank Correlation statistical measurement system.
But GMI's data were put to the test in an October 2009 study that measured the correlationof GMI's rankings to stock performance from mid-2003 to mid-2008.