-
The test chip will enable the correlation of the simulation models to the FinFET process and contains test structures, standard cells, a PLL and embedded SRAMs. The memory instances include high-density SRAMs designed to operate at very low voltages and high-speed SRAMs to validate the process performance.
ENGADGET: Samsung reveals its first 14nm FinFET test chip, should offer substantial power improvements in future silicon
-
As a result, Linaro's resources and open source solutions will allow device manufacturers to speed up development time, improve performance and reduce engineering time spent on non-differentiating, low-level software.
ENGADGET: ARM, Samsung, IBM, Freescale, TI and more join to form Linaro, speed rollout of Linux-based devices
-
Building on Bigfoot Networks' history of high-performance, low-latency desktop PC networking, Killer Wireless-N 1103 adapters deliver superior wireless networking Speed with data rates up to 450Mbps .
ENGADGET: Alienware adds jitter-killing Killer Wireless-N technology to M18x, M17x, M14x and M11x