Countrywide is accused of running a trading scheme from 2007 to 2009 that was deliberately designed to process loans at highspeed without checks on their quality.
The test chip will enable the correlation of the simulation models to the FinFET process and contains test structures, standard cells, a PLL and embedded SRAMs. The memory instances include high-density SRAMs designed to operate at very low voltages and high-speed SRAMs to validate the process performance.