扫描隧道显微镜(STM)的工作方式是把电压加到显微镜探头尖端与被扫描物体这两端，然后检测电流变化。
Scanning tunneling microscope (STM) work by the voltage added to the microscope probe tip and the ends of the scanned object and then detect current changes.
扫描隧道显微镜(STM)的工作方式是把电压加到显微镜探头尖端与被扫描物体这两端，然后检测电流变化。
An STM works by applying a voltage between the microscope's tip and the material it is scanning, and then monitoring the change in current.
测量中，把扫描隧道显微镜的探针扫描线作为参考栅，把物质原子晶格栅结构作为试件栅，对这两组栅线干涉形成的云纹进行了纳米级变形测量。
In the measurement, the moire pattern is generated by the scanning line of scanning tunneling microscope and the atomic lattice of substance as a specimen grating.
光子扫描隧道显微镜(PSTM)是一种高分辨率的扫描探针式显微镜。
Photon scanning Tunneling microscopy (PSTM) is a kind of scanning probe microscopy with high resolution.
通过光学显微镜(OM)，扫描电镜(SEM)和扫描隧道显微镜(STM)观察了光记录有机薄膜的微区结构。
In this paper, optical microscopy (OM), scanning electron microscopy (SEM) and scanning tunneling microscopy (STM) are used to investigate the microstructure of recorded organic thin film.
进一步根据角谱传递函数计算了不同样品的光子扫描隧道显微镜理论图像，分析了探针与样品的间距、探针孔径大小、照明光入射角等对光子扫描隧道显微镜成像的影响。
Based on ASTF the influence of such parameters as tip-sample distance, tip aperture diameter and the incident Angle of illuminating laser beam on PSTM image has been discussed.
进一步根据角谱传递函数计算了不同样品的光子扫描隧道显微镜理论图像，分析了探针与样品的间距、探针孔径大小、照明光入射角等对光子扫描隧道显微镜成像的影响。
Based on ASTF the influence of such parameters as tip-sample distance, tip aperture diameter and the incident Angle of illuminating laser beam on PSTM image has been discussed.
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