本文介绍用四探针技术测量半导体薄层电阻的新方案。

A new method for measuring sheet resistance of semiconductor using four-point probe has been developed.

youdao

本文介绍用四探针技术测量半导体薄层电阻的新方案。

A new method for measuring sheet resistance of semiconductor using four-point probe has been developed.

youdao