通过对XRD图谱分析，所有样品都呈现出六角纤锌矿结构。
Through the analysis of XRD patterns, samples present good hexagonal wurtzite structure.
利用变分法研究纤锌矿结构氮化物半导体材料中的浅杂质态问题。
The shallow impurity states in wurtzite nitrides are studied by a variational method.
常压下纳米硫化锌球壳为纤锌矿结构和闪锌矿结构共存的混相结构。
The raw materials contain two structures of ZnS, which are wurtzite and zinc blende respectively.
XRD结果表明：所得到的样品结晶完好，属于六方形的纤锌矿结构；
The results of XRD indicate that the as-prepared samples are crystallized well and assigned to the hexagonal zincite-structure of ZnO phase.
在氮气气氛下进行退火处理，X射线衍射（XRD）谱表明ZAO薄膜具有六角纤锌矿的晶体结构。
The X-ray diffraction(XRD) patterns show that ZAO thin films has a hexagonal wurtzite structure.
在氮气气氛下进行退火处理，X射线衍射（XRD）谱表明ZAO薄膜具有六角纤锌矿的晶体结构。
The X-ray diffraction(XRD) patterns show that ZAO thin films has a hexagonal wurtzite structure.
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