如果元件或材料发生击穿，全部电压都会加到安培计的输入端，从而可能将其损坏。
If the component or material breaks down, all the voltage would be applied to the ammeter's input, possibly destroying it.
使用分流型安培计(图2 -49)时，输入电容对电流测量的影响与电压测量时类似。
The effects of input capacitance on current measurements using a shunt type ammeter (Figure 2-49) are similar to those for voltage measurements.
由于安培计上的电压降可以忽略，所以所有的测试电压都出现在电阻R上。
Since the voltage drop across the ammeter is negligible, essentially all the test voltage appears across R.
这种电流的降低是由安培计的内阻（RM）引起的，此内阻产生了一个附加的电压降，称为输入端压降（VB）。
This reduction is caused by the internal resistance (RM), which creates an additional voltage drop called the voltage burden (VB).
这种电流的降低是由安培计的内阻（RM）引起的，此内阻产生了一个附加的电压降，称为输入端压降（VB）。
This reduction is caused by the internal resistance (RM), which creates an additional voltage drop called the voltage burden (VB).
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