微动接触电阻测试仪是用于微动过程中接触对电阻动态测试的装置。
The fretting contact resistance test machine is a dynamic test system to measure contact resistance during the fretting progress in contact pairs.
我做的测试超小阻值的仪器，一般用来测试开关继电器的接触电阻！
I do ultra-small resistance test equipment, the general used to test the relay switch contact resistance!
图4 -42说明用来测试一个接点的接触电阻的基本配置。
Figure 4-42 illustrates a basic configuration for testing contact resistance of a contact.
另外，接触电阻对测试值有一定影响。
In addition, the contact resistance also influences the test value.
图4 -43示出使用2182a型纳伏表和2400系列数字源表仪器进行接触电阻测量的测试配置情况。
Figure 4-43 illustrates a test configuration that employs a Model 2182a Nanovoltmeter and a Series 2400 SourceMeter instrument for contact resistance measurements.
该方法简便易行，其定位结果的精度不受击穿点电阻和测试用连接导线的电阻及其接触电阻的影响。
The method features easy operation and good location accuracy that is not affected by the resistance of breakdown spot, the resistance of the test wire and contact resistance.
用动态接触电阻测量系统进行了电磁继电器失效检测试验，监测了其触点闭合过程的接触压降。
The contacts voltage of counterpart contacts in the close course of electromagnetic relay is observed and recorded in its failure tests using dynamic contact resistance measurement system.
用动态接触电阻测量系统进行了电磁继电器失效检测试验，检测了其触点闭合过程的接触压降。
The contact voltage-drop of counterpart contacts in the closing course of electromagnetism relay is observed and recorded in its failure test using dynamic contact resistance measurement system.
导通电阻测试需注意参考点(基准点)选择、接触电阻及现场干扰的影响。
Conduction resistance test should take the effect of base point, contact resistance, and on-site disturbance into account.
从理论和实验两方面讨论了接触电阻对导电混凝土测试电阻和电热效应的影响。
The influences of contact resistance on tested value of resistance and the electrothermal efficiency of electrically conductive concrete were discussed both in theory and experiment.
提出了材料表面接触电阻的测试方法，测试了几种典型材料的表面接触电阻；
The method is presented to test DC contact resistance of shielding materials' surface.
本文中提出了一种测量金属-半导体欧姆接触比接触电阻的新方法-圆环结构测试法。
In this paper, a method to determine the specific contact resistance of metal-semiconductor contact — circular ring structure method is presented.
本文中提出了一种测量金属-半导体欧姆接触比接触电阻的新方法-圆环结构测试法。
In this paper, a method to determine the specific contact resistance of metal-semiconductor contact — circular ring structure method is presented.
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