研制成功了一台THSAM- M型台式多功能声显微镜。
THSAM M multipurpose scanning acoustic microscope was developed.
描述了一种用于检测超精表面形貌的扫描近场声显微镜（SNAM）。
The use of Scanning Near field Acoustic Microscope (SNAM) in measuring the topography of precise surface is presented.
我们能够定位精确是因为操作是在一独特的高分辨率的超声显微镜下引导（该设备在哈佛大学）。
We were able to locate it thanks to unique high-frequency ultrasound microscopic guidance available at Harvard University.
结果表明：利用扫描电子声显微镜技术在不对样品表面进行任何处理的情况下，可以直接对电畴结构进行观察。
The results show that the SEAM technique can be used directly to observe the domain structure of ferroelectric ceramics and single crystal materials without any treatment for test samples.
结果表明：利用扫描电子声显微镜技术在不对样品表面进行任何处理的情况下，可以直接对电畴结构进行观察。
The results show that the SEAM technique can be used directly to observe the domain structure of ferroelectric ceramics and single crystal materials without any treatment for test samples.
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