叙述了为测量半导体光电器件的光电流谱和光反射谱所构成的自动测量系统及其数据处理方法。
The automatic measurement system and the data processing method are discussed for microspot photocurrent spectrum and reflection spectrum of semiconductor optoelectronic devices.
文中分别描述了三种光电器件的光电转换原理，叙述了三种测试系统的组成和工作原理并分析了各方案的优缺点。
The optoelectric detecting and measuring principles, the components as well as the trades-off of three measuring schemes are described separately.
文中分别描述了三种光电器件的光电转换原理，叙述了三种测试系统的组成和工作原理并分析了各方案的优缺点。
The optoelectric detecting and measuring principles, the components as well as the trades-off of three measuring schemes are described separately.
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