光学中心偏测量在光学系统的检测和装校中具有重要的意义。
The optical measurement of decentration is of great significance to detection, fixing and regulating of an optical system.
由于安装误差的存在，同一个透镜每次安装后进行中心偏测量时测量结果都不同。
Owing to the existence of installation error, measuring the same lens after each installation may result in difference.
在介绍了反射式中心偏测量的基本原理的基础上，推导了中心偏测量的迭代公式。
The iterative formula of measurement of optical lens decentration is deduced on the basis of self-collimation catoptric methods.
本文系统地介绍了一种以旋转法为基础的高精度中心偏测量仪的设计和设计中主要考虑的几个问题。
This paper describes in a systematic way a newly-developed off-centre measurement system with high proeision. This method is based on the method of rotation.
借助于数字图像技术，中心偏测试系统通过非接触测量，完成自动聚焦，定位图像中十字中心的位置。
With digital imaging technology, the measurement instrument completes automatic focusing and locates the Crosshair by non-contact measurement.
中心偏的自动化测量避免了人为测量误差，提高了测量精度，为提高仪器的光学质量提供了依据。
The automatic measurement of optical lens avoids man-made measurement errors, enhances the measurement precision, and provides a warrant for improving the quality of optical equipment.
本文描述使用以阻抗测量仪为中心的正偏电容测量系统提取金属-半导体接触界面态参数的方法。
This paper presents a forward-bias capacitance measurement system based on HP 4274AL-C-R meter for extracting the parameters of interface states of metal-semiconductor contacts.
本文描述使用以阻抗测量仪为中心的正偏电容测量系统提取金属-半导体接触界面态参数的方法。
This paper presents a forward-bias capacitance measurement system based on HP 4274AL-C-R meter for extracting the parameters of interface states of metal-semiconductor contacts.
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