他们发现，大脑的尺寸随着人口密度的增长而减小。
They found that brain size decreased as population density increased.
随着MOS器件尺寸逐渐减小，由热载流子效应导致的损伤变得越来越严重，已成为影响器件性能的主要失效机制之一。
With the decrease of the MOS devices size, hot carrier effect failure get more and more heavy, it become one of the main failure mechanisms.
理论证实，随着颗粒尺寸的减小，这一减速效应将增大。
The theory confirms the increase in the retardation effect with decrease in particle size.
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