因此利用边界扫描结构来对系统进行调试的方法应运而生。
Therefore the method making use of boundary scan structure to carry out a debugging on system arises at the historic moment.
并且目前各大公司生产的超大规模集成电路芯片基本全部具有边界扫描结构。
Grand scale IC chip that every important company produces at present is almost all having the boundary scan structure.
为支持板上芯片或逻辑的测试，联合测试行动小组专门设计和定义了一种通用的芯片边界扫描结构及其测试访问端口规范，称为JTAG标准。
Joint test Action Group designed a common chip boundary-scan structure and test access port criterion which is called JTAG standard to support testing on-board chip or logic.
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