文中采用拓扑有限元法,得出非平衡载流子扩散方程的拓扑有限元模型。
Topology-finite-element method is used and a topology-finite-element model for diffusion equation of non-equilibrium carriers is obtained.
通过对载流子扩散机理的研究,由数学公式的推导,得到陷阱电荷分布随电场变化的函数关系。
Substituting the electric field distributions into the formula we ve induced, we got the trapped charge distribution inside the buried oxide during total irradiation under different bias states.
载流子的热弛豫过程与扩散过程在整个衰减过程中所占的比例,取决于激发光子的能量。
The proportion between the thermalization process and diffusion process possess in all the decay process is determined by photon energy of excitation.
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