记录测量设备上那个同时连接到被测器件和第一个模拟输入通道的输出通道。

Note that the analog output is connected to both the DUT input and to the first analog input channel on the measurement device.

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通过产生多个扫描链并将其施加于被测器件(DUT)的多个管脚，可以进一步减少处理时间。

Processing time is further decreased by creating multiple scan chains and applying them to multiple pins of the device under test (DUT).

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通常，测试接点电阻的目的是确定接触点氧化或其它表面薄膜积累是否增加了被测器件的电阻。

Often, the purpose of the contact resistance test is to determine whether contact oxidation or other surface film buildup has increased the resistance of the device under test.

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