射线衍射 XRD ; X-ray diffraction ; WAXD ; PXRD
X射线衍射线仪 X-ray diffractometer
射线衍射线干涉图 XraydiffractionX
X射线衍射线宽化法 X-ray diffraction line broadening method
X射线衍射线形 X-ray diffraction profile
射线衍射仪 ray diffractometer ; XRD ; WAXD ; X-ray diffraction
X射线衍射仪 X-ray diffractometer ; X-ray diffraction ; XRD ; X-vey Piffractometer
射线衍射分析 XRD ; X-ray diffraction ; XRDA ; X-Ray Powder Diffraction
线衍射仪 WAXD
射线衍射图 x ray diffration pattern ; X-raydiffractogramX ; xraydiffrationpatternx
射线衍射线常用多项式拟合移动平滑方法进行处理。
Least squares polynomial smoothing was constantly used in X ray diffraction test.
通常用X射线衍射线的半高宽作为材料表面的强度指标。
In general, the half width of X-ray diffraction is used as a strength index of material surface.
本文讨论了样品表面层有微观应变梯度时X射线衍射线形分析的方法。
This paper deals with X-ray diffraction profile analysis for the sample with a micro-strain gradient in its surface layer.
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