对软基底薄膜热敏电阻器的可靠试验进行了研究，由试验数据找出失效原因，并提出改进措施。
Reliability test of flexible substrate thin-film thermistor is researched. The reasons of failure from the testing date are found and improved advices are pointed out.
本项研究目的是制作微型高精度铂薄膜热敏电阻器与集成电路配合，用于工业和科研中温度的精确测量。
The micro Pt-film thermal resistors of high precision are developed to match the ICs for precise temperature measurement in industry and scientific research.
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