叙述了为测量半导体光电器件的光电流谱和光反射谱所构成的自动测量系统及其数据处理方法。
The automatic measurement system and the data processing method are discussed for microspot photocurrent spectrum and reflection spectrum of semiconductor optoelectronic devices.
本方法可用于导航控制、天线跟踪和遥测数据处理等系统中，可以提高定位的准确性，并进行飞行模式的自动判决。
This filter can be used in navigation, antenna tracking, and telemetry data processing systems to improve the locating accuracy and to realize the flight mode auto judgment.
微叶轮系统的优点表明该系统比其他方法更易于实现与计算机联机的自动化测试及数据处理。
The advantages of the vane wheel system show that it's easier to realize the automatic measurement and date processing with an on line computer for this system than for others.
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