通过相关案例分析，提出稳态热阻的变化量应作为功率器件寿命试验合格判据之一的建议。

This paper suggests that the change of the steady state thermal resistance should become one of the criterions of the life test.

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模拟试验数据分析结果表明，该试验方法可以有效地提高晶体管稳态工作寿命试验方法的可信度。

Analyzing result of simulated experiment data shows that the test method can increase availably the accuracy of the transistor steady-state operation life test method.

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在进行相关分立器件分析时发现，稳态热阻对功率器件寿命试验结果影响较大。

The steady state thermal resistance has important influence on the life test by researching the discrete semiconductor devices.

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