这个现象证明了电感衬底电场和磁场损耗物理模型的有效性。
This phenomenon validates the physical models of the electric field and magnetic field losses of the on-chip inductors in the substrate.
通过直接计算导条损耗与漏磁场能量得出了计及频率影响时转子导条电阻与转子槽漏感。
The rotor bar resistance and slot leakage inductance considering frequency effect are gotten by mean of bar loss calculation and leakage magnetic field energy calculation.
得出了线圈型样品交流损耗与峰值磁场、励磁频率，材料扭矩，基体材料，细芯直径诸量间的依赖关系。
The dependence of the ac loss of coil-type samples on the peak value of magnetic field, magnetizing frequency, pitch of materials, matrix and diameter of filament were obtained.
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