本文提出了线性电压扫描下长产生寿命的快速测量方法。
A method for rapidly determining long generation lifetime under linear voltage sweep was presented.
提出了MOS电容线性电压扫描法产生寿命测量的新方法。
A new method of measuring generation lifetime from linear-sweep MOS Ct transient was suggested.
本文建议子一种由两个不同电压扫描率下的饱和电容值确定产生寿命的实验方法。
An experimental method to determine minority carrier generation lifetime from the values of saturation capacitance under two different voltage sweep rates has been presented.
应用推荐