NBTI测试是现代半导体工艺的一个关键的可靠性测试。
NBTI testing is a critical reliability test for modern semiconductor processes.
对硅的干法刻蚀技术是现代半导体工业中非常重要的一项工艺。
Dry etching technique of silicon is a very important process in the modern semiconductor industry.
在现代半导体材料的X射线分析中,运动学理论由于物理思想清晰而被广泛应用。
X-ray Kinematics, characterized by its clear physical conception, is widely used in modern semiconductor material analysis.
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