薄片电阻率 wafer resistivity
晶片电阻率 slice resistivity
电阻贴片频率选择表面 FSSR
贴片电阻功率 ChipR Rated Power
卡片式电阻率 card-type resistivity
已经设计出专门的探头来测量半导体晶圆片和半导体棒的电阻率。
Special probes have been designed for making resistivity measurements on semiconductor wafers and bars.
因此，在半导体行业中，必须快速、准确地对硅晶圆片导电类型、方块电阻和电阻率进行判断、测量和分档。
Therefore, in the semiconductor industry, we must quickly and accurately type conductive film on silicon wafers, the square resistance and resistivity of judgement, measurement, and grading.
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