对不可测故障进行测试产生是影响时序电路测试产生效率的一个重要因素。

Testing generation of un test faults is a major factor influencing the efficiency of sequential circuits testing generation.

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首先，文章讨论了静态时序分析中的伪路径问题以及路径敏化算法，分析了影响逻辑门和互连线延时的因素。

Firstly, false paths in static timing analysis and the algorithm to sensitize paths are presented, and then some factors affecting gates and interconnects delay are discussed.

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软土地基沉降受众多因素的影响，在时序上表现出复杂的非线性特征。

The settlement of a soft soil foundation often manifests as complicated features at time sequence due to the influence of many factors.

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