...件投稿系统 关键词： 内建自测试；故障覆盖率；确定性测试矢量；测试功耗；可配置LFSR [gap=896]Keywords: BIST;Fault coverage; Deterministic test vectors;Test power consumption;Configurable LFSR ...
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... fault-coverage 故障覆盖 ; 故障覆盖率 fault-coverage rate 故障覆盖率 fault testable coverage 缺陷测试覆盖率 ; 缺陷测试覆盖率 ...
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This method is simple and reliable,and has a high fault coverage.
此方法具有简单可靠，故障覆盖率高的特点。
参考来源 - 基于状态空间模型的线性模拟电路BIST方法Experimental results on ISCAS89 benchmark circuits demonstrate that, compared with the weighted-random-pattern test and Circular Self-test Path(CSTP) method, the TVAC scheme can reach higher fault coverage with smaller test vectors.
实验结果表明，与加权伪随机方法和循环自测试方法相比，该方法可用较少测试矢量达到较高故障覆盖率。
参考来源 - 同步全扫描时序电路的TVAC测试方法?The algorithm can test combined faults with bytes and data maintenance faults of the SRAM. The failure coverage rate is up to 99% to delay faults, abrupt faults, open-circuit faults or address decoder faults.
本文在传统面向比特方式优化March C-算法基础上，给出了面向字节方式优化算法，该算法可对SRAM进行字节内组合故障和数据维持故障测试，对呆滞故障、跳变故障、开路故障、地址译码器故障和字节间组合故障能够达到99％以上的故障覆盖率。
参考来源 - 基于March C·2,447,543篇论文数据，部分数据来源于NoteExpress
高级的软件能帮助你预测手边的测试的故障覆盖率。
Advanced software will help you predict the fault coverage for the test at hand.
用随机测试模式加存储测试模式，来提高故障覆盖率。
To improve the fault coverage, storage-mode is added to LFSR-mode.
基本路径测试是一种重要的白盒测试技术，具有较高的故障覆盖率。
As an important white-box test method, the basic path test has higher fault coverage.
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