金属探头与半导体接触时的电阻可能相当高。
The resistance of the metal probe to semiconductor contact can be quite high.
介绍了接触电位差法固定探头式无损探伤装置的结构，工作原理，测量电路及其频率特性。
The structure, working principle, measuring circuit and frequency characteristics of contact potential difference nondestructive testing equipment using fixed probe am intro - duced.
为了解决这一问题，在本文中我们研究了具有低接触力特性的软探头。
In order to solve this problem, the low-force contact properties of soft probes are investigated in this paper.
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