拆卸运动中的干涉可分为接触干涉和非接触干涉两种基本类型。
The disassembly motion interference could be categorized as contact interference and un-contact interference.
这种接触没有干涉单元或者验收测试目标。
This exposure does not interfere with unit or acceptance tester objectives.
本文提出了一种用光栅分光干涉法测量磁盘平面度的非接触式测量方法。
A grating-differential interferometer for measuring magnetic-disc surface is discussed in this paper.
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