扫描透射电子显微镜(scanning transmission electron microscopy，STEM)既有透射电子显微镜又有扫描电子显微镜的显微镜。STEM用电子束在样品的表面扫描，通过电子穿透样品成像。STEM技术要求较高，要非常高的真空度，并且电子学系统比TEM和SEM都要复杂。
扫描/透射电子显微镜 SEM/TEM
扫描透射式电子显微镜 STEM ; [电子] scanning transmission electron microscope
扫描透射型电子显微镜 scanning transmission electron microscope
透射扫描电子显微镜 transmission scanning electron microscope
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方法应用扫描和透射电子显微镜观察。
MethodsObserving by transmission and scanning electron microscopic method.
并用扫描电子显微镜(sem)、透射电子显微镜(TEM)和原子力显微镜(afm)对阳极氧化铝膜的形貌和结构进行了表征。
The morphologies and structures obtained the anodized aluminum films were characterized by scanning electron microscopy (SEM). Transmission electron microscopy (TEM) and atom force microscopy (AFM).
用扫描和高压透射电子显微镜研究了灰铸铁激光硬化层微区组织形貌和精细结构。
Micromorphology and fine structure in laser hardened layer of grey cast iron have been investigated with scanning electron microscope and high-voltage transmission electron microscope.
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