因此利用边界扫描结构来对系统进行调试的方法应运而生。
Therefore the method making use of boundary scan structure to carry out a debugging on system arises at the historic moment.
并且目前各大公司生产的超大规模集成电路芯片基本全部具有边界扫描结构。
Grand scale IC chip that every important company produces at present is almost all having the boundary scan structure.
提出了一种新颖的直接体积CT扫描结构，即采用面状扫描与点状探测的倒置扫描结构。
This paper proposed a novel scanning structure of direct volume ct, which ADAPTS planar scanning and point detecting, called reverse geometry volume ct.
应用推荐