本发明公开了一种基于扫描链的存储器测试装置及其使用方法。
The invention discloses a memorizer test device based on a scan chain and a use method thereof.
系统级可测性设计主要是将存储器BIST与ARM核的边界扫描测试相结合。
SRAM BIST is also combined with ARM core's boundary scan testing during system level DFT.
该CQP 7000支持标准的信号音广泛，频道扫描和用户可编程存储器的功能，由8个字符的字母数字显示增强。
The CQP7000 supported a wide range of tone signalling standards, channel scanning and user programmable memory features, enhanced by the eight character alphanumeric display.
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