... 步进应力试验 step stress test 序进应力试验 progressive stress test 加速试验 accelerated test ...
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通过对序进应力加速寿命试验的研究，提出了一种快速评价微电子器件失效激活能的方法，建立了计算失效激活能的理论模型。
Basing on the study of progressive stress accelerated life test, a rapid evaluation method for electronic device's activation energy is proposed, and the theory model is constructed.
通过对序进应力加速寿命试验的研究，提出了一种快速评价半导体器件失效激活能的方法，建立了计算失效激活能的理论模型。
Basing on the study of progressive stress accelerated life test, a rapid evaluation method for electronic devices activation energy is proposed, and the theory model is constructed.
讨论了指数分布场合下序进应力加速寿命试验的矩估计问题。
This paper presents moment estimation of the progressive stress accelerated life testing under exponential distribution censored samples.
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