数字式激光平面干涉仪是用于测量光学元件面形和无焦光学系统波像差的光学仪器。
Digital laser plane interferometer is used to measure the surface of optical components and the wavefront aberration of non-confocal optical system.
本文描述了用平面扫描干涉仪测量半导体激光光谱的一种新方法。
The article describes a new method of measuring semiconductor laser spectrum by plane scanning interferometer.
本文介绍了制作全息平面光栅的两种干涉仪系统。所得到的光栅分别用于不同的分光仪器中。
In this paper, two different interference systems for making plane holographic gratings are presented. The gratings obtained can be used in various types of spectroscopes.
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