射线衍射分析法适宜于分析有机显微组分的芳环层的层状结构。
X-ray diffraction analysis can be used for analysing the layer structure of aromatic cluster in organic macerals.
X射线衍射分析法适宜于分析有机显微组分的芳环层的层状结构。
X-ray diffraction analysis can be used for analysing the layer structure of aromatic cluster in organic macerals.
采用X—射线衍射分析法、显微硬度测试法和盐雾试验法来检测镀层性能。
Properties of the Zn-Ni alloy deposit were determined with the methods of X-ray diffraction analysis, microhardness and salt -spray test.
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