对于这个示例来说，这个存储器是由一个简单且短暂的散列表实现的，并由一个生成实现类的工厂提供(清单3和清单4)。
For this example, this store is implemented with a simple, ephemeral hash table and is provided with a factory for generating the implementation class (Listings 3 and 4).
BIST控制器不仅可以执行传统的存储器测试算法，而且可以生成用于逻辑模块的测试向量。
The BIST controller can not only perform traditional memory test algorithms but also generates test patterns required for the logic part.
另外本文还比较详细的分析比较了常用的存储器测试算法，简要分析了VLSI测试生成算法。
In addition, the detailed analysis of some frequently used memory test algorithms and brief analysis of some test generation algorithms for VLSI are also included in this paper.
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