综合评价问题的本质是把评价对象的可测指标转换为较抽象的功能性指标。
The essence of synthetic evaluation problem is to transform these measurable attributes of object under evaluation into its functional attributes which are usually abstract and synthetic.
提出了一种在内建自测试(BIST)中进行部分扫描的算法，此算法综合了电路的结构分析和可测性分析。
A partial scan algorithm for BIST, which combines the structure analysis and testability analysis, is presented in this paper.
介绍了综合软件、硬件、计算机体系结构、超大规模集成技术和可测性的设计方法。
The structured design of integrating software, hardware, computer architecture, VLSI technology and testability together, is introduced.
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