透射电子显微镜呈像的方法是对物体发射万亿电子，测量它们的吸收，偏斜和能量损失。

Transmission electron microscopy creates images by shooting trillions of electrons through an object and measuring their absorption, deflection and energy loss.

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以X射线衍射（XRD）、透射电子显微镜（TEM）、发射光谱和衰减时间谱等手段表征材料性能。

The morphology, structure, and photoluminescence(PL) of the phosphors were investigated by transmission electron microscope(TEM), X-ray diffraction(XRD), emission spectra, and decay time.

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采用透射光栅和软x光条纹相机测量了铜激光等离子体软x光发射的时间分辨光谱。

Time resolved soft X-ray (SXR) spectra of copper laser plasmas are measured by involving a SXR streak camera with a SXR transmission grating.

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