本文报道利用红外分光光度计和微机系统，采用二次测量技术，测量材料表面法向光谱发射率的基本原理和测试方法。
The experimental principle and the method to measure the normal spectral emittance of materials by infrared spectrophotometer and microcomputer system are presented.
采用RF—5301PC荧光分光光度计测定激发光谱、发射光谱和磷光衰减曲线；
The photoluminescence spectra and the decay curves were recorded on RF-5301PC.
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