本课程全面介绍了半导体物理及半导体器件的理论基础。
This course deals with the theory base of semiconductor physics and semiconductor device in detail.
分别比较了不同的半导体电子器件的材料、理论和所采用的制备技术。
And the materials, theories and manufacture techniques adopted by different semiconductor electron device are compared.
通过对序进应力加速寿命试验的研究，提出了一种快速评价半导体器件失效激活能的方法，建立了计算失效激活能的理论模型。
Basing on the study of progressive stress accelerated life test, a rapid evaluation method for electronic devices activation energy is proposed, and the theory model is constructed.
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