对电感耦合等离子体原子发射光谱法（ICP AES）测定金属硅中铁杂质含量的不确定度进行了合成和评估。
The combination and estimation of the uncertainty in the determination of Fe in metallic silicon using Inductively Coupled Plasmas Atomic Emissive Spectrometry(ICP-AES) is described.
针对发射光谱法测量1 5n同位数原子丰度产生误差的原因进行了详细分析。
The error produced in measuring 15n abundance by emissive optical spectrometry is analyzed in detail.
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