对微波光电导法测量半导体少数载流子寿命的测试系统进行灵敏度分析。
The sensitivity for the semiconductor minority carrier lifetime measurement system was determined using microwave photoconductance decay.
本文制备了三个不同形态比的卤化银乳剂，用介电损耗法和微波光导法分别测定了它们的离子电导和光电导衰变动力学。
The dielectric loss and the microwave photoconductivity methods were used to determine the ionic conductivity and the photo-electron decay kinetics of the emulsion microcrystals.
应用傅立叶红外仪测量了薄膜的红外谱，用共面蒸铝电极法测量了薄膜的光电导。
We got the infrared spectra by The Fourier Transform Infrared (FTIR) spectroscope and measured the thin films' photoconductivity using Coplanar Aluminum Plating Electrode methods.
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