研制了一种新型的探测器，利用气体放电和外部电路猝灭的方法测定样品表面发射的低能光电子。
We have studied and constructed a new detector by gas discharge and external quenching circuits to measure the low energy photoelectron emitted form the specimen surface.
辉光放电光电子谱仪（GDS）渗层成分检测结果表明表面含碳量可达29.8%，合金渗层的碳含量也呈梯度分布；
GDS testing results indicate the carbon content of the surface reaches 29.8%, the carbon content in the alloyed layer emerges in gradient distribution too.
经过若干次等离子体放电实验后，取出样品进行表面形貌、表面元素成分及深度分布的X射线光电子能谱分析。
After plasma irradiation, the specimen surface morphology was observed by SEM and the element composition of the coatings was analysed by XPS.
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