用原子力显微镜（AFM）研究了电场诱导氧化理论以及偏置电压和脉冲时间对加工结构尺寸的影响。
The theory of field-induced oxidation and the impact of bias voltage and pulse time on the nanofabrication were studied by AFM.
根据处于脉冲偏置的红外热像仪噪声等效温差的表达式，分析了影响噪声等效温差的几个因素。
Several factors that affect the accuracy of noise equivalent temperature difference (NETD) are demonstrated according to the equation of NETD of the infrared imager under pulse bias.
如果可能的话，不要使用偏置补偿(脉冲电流)。因为对脉冲电流的感抗可能会使测量不稳定，或者使自动量程功能难于工作。
If possible, do not use offset compensation (pulsed current) because inductive reaction to the current pulse may cause unstable measurements or make autoranging difficult.
应用推荐