再次，在已有的可靠度计算方法的基础上，给出了单元工作在安全、中介和失效三种情况下，其工作概率的计算方法和步骤。
Thirdly, calculation method and step for the probability of the element in safety state, intermediate state and failure state are given which is based on the general reliability analysis.
文中介绍了一种基于概率方法的半导体发光器件可靠性预计模型。
This study is a step to develop a complete physics-of-failure-based reliability prediction methodology for semiconductor light-emitting devices.
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