The X-ray diffraction(XRD) patterns show that ZAO thin films has a hexagonal wurtzite structure.

在氮气气氛下进行退火处理，X射线衍射（XRD）谱表明ZAO薄膜具有六角纤锌矿的晶体结构。

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X-ray Diffraction(XRD)was applied to study crystalline properties of PLT films, and XRD patterns of PLT thin films show that there appeared(111)preferred-oriented tetragonal perovskite phase.

用X射线衍射技术（XRD）研究了PLT薄膜结晶性能，结果表明PLT薄膜为（111）择优取向钙钛矿相织构。

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