Then, the films were characterized with X ray photoelectron spectroscopy(XPS), X ray diffraction(XRD), ultraviolet visible light absorption spectroscopy, and atomic force microscopy(AFM).
用X光电子能谱、X射线衍射、紫外可见吸收光谱、原子力显微镜等手段对制备的薄膜进行了表征。
The x-ray diffraction (XRD), x-ray photoelectron spectroscopy (XPS)and scanning electronic microscopy (SEM)were employed to analyze the structure, composition and surface morphology of the films .
用x射线衍射（XRD）、扫描电镜（SEM）和x光电子能谱（XPS）对样品进行了结构、形貌及组分分析。
The elementary composition of PANI-SnP composite films in reduced and oxidized form were also characterized by energy dispersive X-ray spectroscopy (EDS) and X-ray photoelectron spectroscopy (XPS).
通过X射线能谱仪（EDS）和X射线光电子能谱（XPS）分别测定了复合膜在氧化和还原状态下的元素组成。
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