An optoelectronic inspection system based on the direct imagery theory is presented for non-contact observation of the micro-profile of a small area, especially that of the underside of a micro-pore.
针对微小面积，特别是微小“盲孔”底面形貌的非接触精密检测，提出了一种基于直接成像原理的光学结构。
This paper designs the surface defect detection system to reach real time automation inspection for Nd-Fe-B small magnetic rings.
本文针对钕铁硼永磁材料的小型磁环，设计磁环表面缺陷检测系统，实现对磁环表面的实时自动检测。
CMOS digital image sensor has the merits as low power, small size and high level of integration, which can meet the demand of distributed visual inspection system.
CMOS数字图像传感器具有功耗低、体积小、集成度高等优点，能够满足分布式视觉检测系统的要求。
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